| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2019-01-18 |
| タイトル |
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タイトル |
Numerical Simulation of Single-Electron Tunneling in Random Arrays of Small Tunnel Junctions Formed by Percolation of Conductive Nanoparticles |
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言語 |
en |
| 言語 |
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|
言語 |
eng |
| キーワード |
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言語 |
en |
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主題 |
single-electron effects |
| キーワード |
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言語 |
en |
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主題 |
percolation |
| キーワード |
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言語 |
en |
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主題 |
circuit simulation |
| キーワード |
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言語 |
en |
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主題 |
Monte-Carlo simulation |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| 著者 |
MIZUGAKI, Yoshinao
SHIMADA, Hiroshi
HIRANO-IWATA, Ayumi
HIROSE, Fumihiko
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| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
We numerically simulated electrical properties, i.e., the resistance and Coulomb blockade threshold, of randomly-placed conductive nanoparticles. In simulation, tunnel junctions were assumed to be formed between neighboring particle-particle and particle-electrode connections. On a plane of triangle 100×100 grids, three electrodes, the drain, source, and gate, were defined. After random placements of conductive particles, the connection between the drain and source electrodes were evaluated with keeping the gate electrode disconnected. The resistance was obtained by use of a SPICE-like simulator, whereas the Coulomb blockade threshold was determined from the current-voltage characteristics simulated using a Monte-Carlo simulator. Strong linear correlation between the resistance and threshold voltage was confirmed, which agreed with results for uniform one-dimensional arrays. |
| 書誌情報 |
en : IEICE Transactions on Electronics
巻 E101.C,
号 10,
p. 836-839,
発行日 2018-10-01
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| 出版者 |
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出版者 |
IEICE |
| ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
0916-8524 |
| DOI |
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関連タイプ |
isIdenticalTo |
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識別子タイプ |
DOI |
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関連識別子 |
10.1587/transele.E101.C.836 |
| 権利 |
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権利情報 |
copyright©2018 IEICE |
| 関連サイト |
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識別子タイプ |
URI |
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関連識別子 |
http://search.ieice.org/index.html |
| 著者版フラグ |
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出版タイプ |
VoR |
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出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
e101-c_10_836 (2.5 MB)
