{"created":"2023-05-15T08:44:09.145247+00:00","id":9419,"links":{},"metadata":{"_buckets":{"deposit":"1fda0450-6769-426d-9d21-84b0628f53fc"},"_deposit":{"created_by":13,"id":"9419","owners":[13],"pid":{"revision_id":0,"type":"depid","value":"9419"},"status":"published"},"_oai":{"id":"oai:uec.repo.nii.ac.jp:00009419","sets":["6"]},"author_link":["25702","25704","25705","25703","25706","25707"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"21","bibliographicPageEnd":"4974","bibliographicPageStart":"4971","bibliographicVolumeNumber":"41","bibliographic_titles":[{},{"bibliographic_title":"Optics Letters","bibliographic_titleLang":"en"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We demonstrate rapid characterization of complex optical properties of solids via dual-comb spectroscopy (DCS) in the near-infrared region. The fine spectral structures in the complex refractive index of an Er:YAG are successfully deduced using the developed system and Fourier analysis. Moreover, simultaneous determination of the refractive index and the thickness is demonstrated for a silicon semiconductor wafer through the use of multireflected echo signals. The results indicate the potential of DCS as a powerful measurement tool for the rapid and full characterization of solid materials.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Optical Society of America (OSA)"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1364/OL.41.004971","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1364/OL.41.004971","subitem_relation_type_select":"DOI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"© 2016 Optical Society of America"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0146-9592","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Asahara, Akifumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nishiyama, Akiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoshida, Satoru","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kondo, Ken-ichi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nakajima, Yoshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Minoshima, Kaoru","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-12-23"}],"displaytype":"detail","filename":"Asahara_OL274512_Converted.pdf","filesize":[{"value":"748.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"Asahara_OL274512_Converted","url":"https://uec.repo.nii.ac.jp/record/9419/files/Asahara_OL274512_Converted.pdf"},"version_id":"4669c47c-bf7b-4cb4-baa1-c30fab2cd987"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Dual-comb spectroscopy for rapid characterization of complex optical properties of solids","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Dual-comb spectroscopy for rapid characterization of complex optical properties of solids","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"13","path":["6"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-12-23"},"publish_date":"2019-12-23","publish_status":"0","recid":"9419","relation_version_is_last":true,"title":["Dual-comb spectroscopy for rapid characterization of complex optical properties of solids"],"weko_creator_id":"13","weko_shared_id":-1},"updated":"2023-05-15T10:13:41.820360+00:00"}