@article{oai:uec.repo.nii.ac.jp:00009419,
 author = {Asahara, Akifumi and Nishiyama, Akiko and Yoshida, Satoru and Kondo, Ken-ichi and Nakajima, Yoshiaki and Minoshima, Kaoru},
 issue = {21},
 journal = {Optics Letters},
 month = {Nov},
 note = {We demonstrate rapid characterization of complex optical properties of solids via dual-comb spectroscopy (DCS) in the near-infrared region. The fine spectral structures in the complex refractive index of an Er:YAG are successfully deduced using the developed system and Fourier analysis. Moreover, simultaneous determination of the refractive index and the thickness is demonstrated for a silicon semiconductor wafer through the use of multireflected echo signals. The results indicate the potential of DCS as a powerful measurement tool for the rapid and full characterization of solid materials.},
 pages = {4971--4974},
 title = {Dual-comb spectroscopy for rapid characterization of complex optical properties of solids},
 volume = {41},
 year = {2016}
}