{"created":"2023-05-15T08:43:47.518653+00:00","id":8878,"links":{},"metadata":{"_buckets":{"deposit":"390cec80-e465-421b-b7cc-82334e01c60d"},"_deposit":{"created_by":13,"id":"8878","owners":[13],"pid":{"revision_id":0,"type":"depid","value":"8878"},"status":"published"},"_oai":{"id":"oai:uec.repo.nii.ac.jp:00008878","sets":["6"]},"author_link":["24149","24150","24151","24152"],"control_number":"8878","item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"920","bibliographicPageStart":"909","bibliographicVolumeNumber":"J101-D","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D, 情報・システム","bibliographic_titleLang":"ja"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"適応型テストとは，受検者の能力を逐次的に推定し，その能力に応じて測定精度が最も高い項目を出題するコンピュータ・テスティングの出題形式である．この手法では，易しすぎる項目や難しすぎる項目の出題が減少するため，受検者の測定精度を減少させずに受検時間や項目数を軽減できる．しかし，従来の適応型テストでは，能力が同等な受検者には全く同じ項目群が出題される可能性が高く，実際に適応型テストを導入しているSPIやGTECの重要な問題になっている．本研究では，能力が同等な受検者であっても異なる項目を同一の測定精度を保ちつつ適応的に出題できる等質適応型テストを提案する．具体的には，提案手法では次のように項目出題を行う．1）2017年時点で最先端の複数等質テスト構成手法を用いて，異なる項目で構成されるが測定精度が等質になるような等質テストを多数構成する．2）受検者ごとに異なる等質テストを一つ割り当て，そのテスト内の項目集合をアイテムバンクとみなして適応型テストを実施する．本論では，シミュレーション実験と実データを用いた実験により提案手法の有効性を示す．","subitem_description_type":"Abstract"},{"subitem_description":"Adaptive testing is a question format of computer testing that estimates an examinee's ability sequentially and which produces question items with the highest estimation accuracy according to the examinee's ability. The technique mitigates the creation of overly easy or overly difficult questions, which can reduce the time spent on a test, and reduces the number of items without reducing the estimation accuracy for the examinee's ability. However, in conventional adaptive tests, it is highly likely that the exact same group of items will be prepared for examinees who have equivalent ability. The tests cannot be used practically under circumstances by which the same learner can take a test multiple times, such as SPI and GTEC. In this paper, we propose a multiple equivalent adaptive test that adaptively creates different items for examinees even if those with equivalent capabilities, maintaining the same evaluation accuracy. Specifically, we follow the procedure outlined below. 1) We compose an item cluster for a multiple equivalent test based on the amount of test information so that the measurement accuracy for examinees'ability can be equivalent despite consisting of different items. To compose a multiple equivalent test, we use a technique that employs the maximum clique problem to maximize the number of compositions from items within an item bank. 2) Regarding an item cluster for a multiple equivalent test as an item bank, we propose a multiple equivalent adaptive test that estimates the value of an examinee's ability sequentially and which selects items with the greatest amount of information for the value of ability from an item cluster for a multiple equivalent test. This paper presents the effectiveness of the technique through a simulation experiment and with item banks used by actual test providers.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.14923/transinfj.2017LEP0028","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://search.ieice.org/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright © 2018 IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1881-0225","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮澤, 芳光","creatorNameLang":"ja"},{"creatorName":"ミヤザワ, ヨシミツ","creatorNameLang":"ja-Kana"},{"creatorName":"MIYAZAWA, Yoshimitsu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"宇都, 雅輝","creatorNameLang":"ja"},{"creatorName":"ウト, マサキ","creatorNameLang":"ja-Kana"},{"creatorName":"UTO, Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"石井, 隆稔","creatorNameLang":"ja"},{"creatorName":"イシイ, タカトシ","creatorNameLang":"ja-Kana"},{"creatorName":"ISHII, Takatoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"植野, 真臣","creatorNameLang":"ja"},{"creatorName":"ウエノ, マオミ","creatorNameLang":"ja-Kana"},{"creatorName":"UENO, Maomi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-01-15"}],"displaytype":"detail","filename":"j101-d_6_909.pdf","filesize":[{"value":"769.6 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"j101-d_6_909","url":"https://uec.repo.nii.ac.jp/record/8878/files/j101-d_6_909.pdf"},"version_id":"8a2b152b-e3a3-4aae-af9c-5583e0e8c95f"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"適応型テスト","subitem_subject_scheme":"Other"},{"subitem_subject":"eテスティング","subitem_subject_scheme":"Other"},{"subitem_subject":"複数等質テスト","subitem_subject_scheme":"Other"},{"subitem_subject":"項目反応理論","subitem_subject_scheme":"Other"},{"subitem_subject":"computerized adaptive testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"e-Testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"uniform test form assembly","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"item response theory","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"測定精度の偏り軽減のための等質適応型テストの提案","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"測定精度の偏り軽減のための等質適応型テストの提案","subitem_title_language":"ja"},{"subitem_title":"A Proposal of Uniform Adaptive Testing for Reducing Measurement Error Bias","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"13","path":["6"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2019-01-15"},"publish_date":"2019-01-15","publish_status":"0","recid":"8878","relation_version_is_last":true,"title":["測定精度の偏り軽減のための等質適応型テストの提案"],"weko_creator_id":"13","weko_shared_id":-1},"updated":"2024-03-05T06:29:13.166868+00:00"}