{"created":"2023-05-15T08:42:10.633366+00:00","id":6821,"links":{},"metadata":{"_buckets":{"deposit":"ff7b6448-9c89-41d3-965f-37ff2ca9f3e7"},"_deposit":{"created_by":3,"id":"6821","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6821"},"status":"published"},"_oai":{"id":"oai:uec.repo.nii.ac.jp:00006821","sets":["7:52"]},"author_link":["16176","16177","16178","16179"],"control_number":"6821","item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-01-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"184","bibliographicPageStart":"179","bibliographicVolumeNumber":"16","bibliographic_titles":[{"bibliographic_title":"電気通信大学紀要","bibliographic_titleLang":"ja"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The purpose in the laboratory experiments of logic circuits design, is students to study how tocarry out the software design and hardware design according to each function, and evaluate thedesign in consideration of the trade-off problem.Therefore, paying attention to the modularity and hierarchy of logic circuits design, studentsassemble and test logic circuits, and they study design know-how about logic circuits.As FORTH system has an interactive programming environment and its modularity is suitable toreplace hardware function by software function, we adopt FORTH system for logic circuitslaboratory work.In this paper, new experiment environment of logic circuits design using FPGA, and laboratorywork tools by FORTH system are presented.","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電気通信大学"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0915-0935","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"齋藤, 正和","creatorNameLang":"ja"},{"creatorName":"サイトウ, マサカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Saito, Masakazu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藁科, 崇","creatorNameLang":"ja"},{"creatorName":"ワラシナ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"Warashina, Takashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高橋, 光生","creatorNameLang":"ja"},{"creatorName":"タカハシ, ミツオ","creatorNameLang":"ja-Kana"},{"creatorName":"Takahashi, Mitsuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"田中, 清臣","creatorNameLang":"ja"},{"creatorName":"タナカ, キヨオミ","creatorNameLang":"ja-Kana"},{"creatorName":"Tanaka, Kiyoomi","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-11-01"}],"displaytype":"detail","filename":"9000000178.pdf","filesize":[{"value":"83.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"9000000178.pdf","url":"https://uec.repo.nii.ac.jp/record/6821/files/9000000178.pdf"},"version_id":"27741341-95d9-454c-bc0a-22cd9f98348b"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"電子工学実験におけるFORTHの利用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電子工学実験におけるFORTHの利用","subitem_title_language":"ja"},{"subitem_title":"FORTH based logic circuits laboratory work","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"3","path":["52"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2010-02-16"},"publish_date":"2010-02-16","publish_status":"0","recid":"6821","relation_version_is_last":true,"title":["電子工学実験におけるFORTHの利用"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2024-02-27T07:43:22.906766+00:00"}