{"created":"2023-05-15T08:44:47.476696+00:00","id":10083,"links":{},"metadata":{"_buckets":{"deposit":"5bb8c2ea-74fe-4f41-9691-7fd13417ebe9"},"_deposit":{"created_by":13,"id":"10083","owners":[13],"pid":{"revision_id":0,"type":"depid","value":"10083"},"status":"published"},"_oai":{"id":"oai:uec.repo.nii.ac.jp:00010083","sets":["6"]},"author_link":["26958","24126"],"control_number":"10083","item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"893","bibliographicPageStart":"881","bibliographicVolumeNumber":"J103-D","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. D, 情報・システム","bibliographic_titleLang":"ja"},{"bibliographic_title":"D - Abstracts of IEICE TRANSACTIONS on Information and Systems(Japanese Edition)","bibliographic_titleLang":"en"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"本論文では，等質テスト構成のための整数計画法を用いた最大クリークの並列化探索手法を提案する．等質テストとは各テストで出題される項目が異なるが，受験者得点の予測誤差が等質なテスト群である．等質テストでは同一能力の受験者が異なるテストを受験しても同一の得点となる保証があり，アイテムバンクから可能な限り多く生成することが望ましい．石井ら（2017）は等質テスト構成を最大クリーク問題と整数計画法により，従来手法より多くのテストを構成できる手法を提案した．本論文では，石井ら（2017）の手法で最も時間を要する整数計画法による逐次的頂点追加処理を並列化することを考える．具体的には，探索中のクリークの全頂点と隣接する頂点集合を候補頂点集合として，逐次的に整数計画法の解を追加し，要素数が一定となるまで並列化して繰り返し，この要素の最大クリークを追加することで探索を高速化できる．この提案手法の有効性は最大で従来手法で生成されるテスト数が194575個であったのに対し，438950個にテスト生成数を更新した．","subitem_description_type":"Abstract"},{"subitem_description":"Educational assessments occasionally require uniform test forms for which each test form consists of a different set of items, but the forms meet uniform test specifications. For uniform test assembly, one of the most important issues is to incarease the number of assembled tests. Ishii et al. (2017) proposed using maximum clique problem and interger programming. The method assembled more uniform tests than traditional methods do. The proposal can be parallel searching vertices connected to all vertices in current clique. Ishii et al. (2017) method spend almost time for this process and impossible parallel algorithm, thus, the proposal can assemble a greater number of tests then the previous methods. As a result, the proposal assembled 438950 uniform tests as compared with 194575 uniform tests using the previous methods.","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"電子情報通信学会"}]},"item_10001_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"10.14923/transinfj.2020JDP7004","subitem_relation_type_select":"DOI"}}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://search.ieice.org/index.html","subitem_relation_type_select":"URI"}}]},"item_10001_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2020 IEICE"}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"18810225","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渕本, 壱真","creatorNameLang":"ja"},{"creatorName":"フチモト, カズマ","creatorNameLang":"ja-Kana"},{"creatorName":"FUCHIMOTO, Kazuma","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"植野, 真臣","creatorNameLang":"ja"},{"creatorName":"ウエノ, マオミ","creatorNameLang":"ja-Kana"},{"creatorName":"UENO, Maomi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2022-02-02"}],"displaytype":"detail","filename":"等質テスト構成～（渕本、植野）.pdf","filesize":[{"value":"2.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"等質テスト構成～（渕本、植野）","url":"https://uec.repo.nii.ac.jp/record/10083/files/等質テスト構成～（渕本、植野）.pdf"},"version_id":"c5fa3eec-00f5-4cea-b388-bbcd6ae1b1fa"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"eテスティング","subitem_subject_language":"ja","subitem_subject_scheme":"Other"},{"subitem_subject":"項目反応理論","subitem_subject_language":"ja","subitem_subject_scheme":"Other"},{"subitem_subject":"等質テスト自動構成","subitem_subject_language":"ja","subitem_subject_scheme":"Other"},{"subitem_subject":"最大クリーク問題","subitem_subject_language":"ja","subitem_subject_scheme":"Other"},{"subitem_subject":"整数計画法","subitem_subject_language":"ja","subitem_subject_scheme":"Other"},{"subitem_subject":"e-testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"item response theory","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"uniform tests assembly","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"maximum clique problem","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"integer programming","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"等質テスト構成における整数計画法を用いた最大クリーク探索の並列化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"等質テスト構成における整数計画法を用いた最大クリーク探索の並列化","subitem_title_language":"ja"},{"subitem_title":"Parallel Maximum Clique Algorithm Using Integer Programming for Uniform Test Forms Assembly","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"13","path":["6"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2022-02-02"},"publish_date":"2022-02-02","publish_status":"0","recid":"10083","relation_version_is_last":true,"title":["等質テスト構成における整数計画法を用いた最大クリーク探索の並列化"],"weko_creator_id":"13","weko_shared_id":-1},"updated":"2024-03-07T02:22:57.331105+00:00"}