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Dual-comb spectroscopy for rapid characterization of complex optical properties of solids
https://uec.repo.nii.ac.jp/records/9419
https://uec.repo.nii.ac.jp/records/941980417e89-ac2a-4bec-bb4f-8f2c421449ce
名前 / ファイル | ライセンス | アクション |
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Asahara_OL274512_Converted (748.7 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2019-12-23 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Dual-comb spectroscopy for rapid characterization of complex optical properties of solids | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Asahara, Akifumi
× Asahara, Akifumi× Nishiyama, Akiko× Yoshida, Satoru× Kondo, Ken-ichi× Nakajima, Yoshiaki× Minoshima, Kaoru |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We demonstrate rapid characterization of complex optical properties of solids via dual-comb spectroscopy (DCS) in the near-infrared region. The fine spectral structures in the complex refractive index of an Er:YAG are successfully deduced using the developed system and Fourier analysis. Moreover, simultaneous determination of the refractive index and the thickness is demonstrated for a silicon semiconductor wafer through the use of multireflected echo signals. The results indicate the potential of DCS as a powerful measurement tool for the rapid and full characterization of solid materials. | |||||
書誌情報 |
en : Optics Letters 巻 41, 号 21, p. 4971-4974, 発行日 2016-11-01 |
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出版者 | ||||||
出版者 | Optical Society of America (OSA) | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0146-9592 | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1364/OL.41.004971 | |||||
権利 | ||||||
権利情報 | © 2016 Optical Society of America | |||||
関連サイト | ||||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1364/OL.41.004971 | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa |